Key Points:
- Osaka University developed a new technique for fast and accurate electronic temperature measurement using neutron resonance absorption (NRA).
- The method is non-destructive and suitable for monitoring batteries and semiconductor devices. NRA can acquire temperature data in 100 nanoseconds.
- The measurement device is a tenth of the size of similar equipment, facilitating easier installation in other laboratories.
- This technique allows detailed electronic examination, helping to understand normal operating conditions and pinpoint abnormalities.
Electronics, from LEDs to batteries, play a crucial role in our daily lives, driving a continuous push to enhance efficiency and reliability. As these components become more sophisticated, obtaining accurate temperature measurements of specific elements inside devices poses significant challenges. Reliable temperature measurements are vital for monitoring performance and designing materials.
A recent study led by Osaka University, published in Nature Communications, introduces a groundbreaking method using neutrons to measure temperatures quickly and accurately. This method could potentially improve performance across various electronics.
Traditional methods to estimate the temperature inside electronic devices have limitations, often failing to provide fast, direct measurements. The new method employs ‘neutron resonance absorption’ (NRA). This technique examines neutrons absorbed by atomic nuclei at certain energy levels to deduce the material’s properties. High-intensity laser beams generate the neutrons, which are then decelerated to very low energy levels before passing through the sample. Tested on plates of tantalum and silver, the technique successfully returned material and temperature details with exceptional speed.
The researchers could determine the samples’ temperature by observing the predictable changes in the NRA’s temporal signal as the sample material’s temperature varied. Zechen Lan, the lead author, explains, “This technology makes it possible to instantaneously and accurately measure temperature. As our method is non-destructive, it can be used to monitor devices like batteries and semiconductor devices.”
A significant advantage of the NRA measurement is its execution with a single pulse of neutrons, acquiring temperature data within 100 nanoseconds—one ten-millionth of a second. This near-instantaneous result allows real-time measurement of changes within a material, facilitating detailed analysis.
Senior author Akifumi Yogo highlights the innovation: “Using lasers to generate and accelerate ions and neutrons is nothing new, but the techniques we’ve developed in this study represent an exciting advance. We expect that the high temporal resolution will allow electronics to be examined in greater detail, help us understand normal operating conditions, and pinpoint abnormalities.”
Another accomplishment is the measurement device developed by the research team, which is about a tenth of the size of similar equipment. This compact design makes it easier for other laboratories to install their versions.
The ability to quickly and accurately measure the operating temperatures of devices and their materials can significantly advance understanding of how they function and how they can be improved. This new neutron technique represents a significant step forward in electronics, offering potential efficiency, reliability, and performance enhancements.
